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08:30 AM – 09:00 AM: Introduction:
Overview of Tutorial Scope and Agenda
Speakers: Pradip Bose (IBM), Pat Bohrer (IBM), David Brooks (Harvard
University)
09:00 AM – 10:15 AM: Transformational
Hybrid (Multi-Core) Systems: Technology Outlook and Associated Modeling
Challenges
Speakers: Jaime Moreno, Senior Manager, Dept. of Computer Architecture,
IBM T. J. Watson Research Center, Yorktown Heights, NY
10:15 AM – 11:00 AM:
Software-Integrated Full System Simulation Methodologies
Speakers: Patrick Bohrer, IBM Austin Research Center
11:00 AM – 11:45 AM: Multi-Core Memory
Modeling Fundamentals
Speakers: Hillery Hunter, IBM T. J. Watson Research Center, Yorktown
Heights, NY
11:45 AM – 12:00 PM: Discussion, Q&A
12:00 PM – 01:30 PM: LUNCH BREAK
01:30 PM – 03:00 PM: Integrated
Power-Performance-Thermal-Reliability Modeling for Multi-Core Systems
Speakers: Pradip Bose (IBM) and David Brooks (Harvard University)
03:00 PM – 03:30 PM: On-chip Voltage
Control for CMPs
Speakers: David Brooks (Harvard University)
03:30 PM – 04:15 PM: Adaptive Thread
Management (and Associated Modeling Challenges) for Multi-Cores
Speakers: Jonathan Winter, Cornell University (joint work with Prof. David
Albonesi)
04:15 PM – 05:00 PM: SWAT: Handling
Hardware and Software Failures in the Multi-Core Era
Speakers: Alex Li and Pradeep Ramachandran, UIUC (joint work with Prof.
Sarita Adve et al.)
05:00 PM – 05:30 PM: Wrap up, open-mic
Q&A participation from audience
(moderated by David Brooks and Pradip Bose)
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Abstract
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Pre-silicon function and performance modeling in the 21st century
has quickly evolved, out of technology-driven necessity, into an
integrated modeling art or science. No longer is it meaningful for
architects to study performance (IPC) sensitivities in isolation,
while product quality metrics like power, temperature and
reliability are modeled only in late-stage design. With
cycle-accurate performance models augmented with the burden of also
projecting the above other quality-related metrics, issues related
to simulation speed and analysis accuracy get magnified by a large
factor. Also, increasingly, the software scaling attributes and
memory queuing effects need to be modeled with greater precision
than before, in projecting performance and power for large n-way
systems, built out of tomorrow’s multi/many-core chips. Similarly,
pre-silicon functional validation often involves factoring the
effect of multiple operational modes, associated with dynamic
resource management. In this tutorial, we propose to present the
modern challenge of pre-silicon modeling and validation (of
software-integrated multi-core systems) from the perspective of real
industrial microprocessor and associated system design projects. We
will also examine the techniques to model the benefits (and
performance degradations) derived from on-chip power, temperature
and reliability management devices within the framework of current
generation multi-core integrated models. We will discuss methods of
validating pre-silicon integrated models and present real data to
illustrate the errors that can result from inadequate high-level
abstractions during early-stage modeling. We will cover academic
research concepts that have benefited or influenced industrial
practice in all aspects of the above problem, and we will point to
open research issues and problems that need to be solved –
especially in the context of technological changes brought forth by
3D chip integration.. |
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Organizers
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Pradip Bose, IBM T. J. Watson Research Center,
Yorktown Heights, NY
Patrick Bohrer, IBM Austin Research
Laboratory, Austin, TX
David Brooks, School of Engineering and
Applied Sciences, Harvard University, Cambridge, MA
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Reference List
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D. Brooks et al.,
“Wattch: a framework for architecture-level power analysis and
optimization,” 27th International
Symposium on Computer Architecture (ISCA-27), June 2000.
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N. Vijaykrishnan et
al., “Energy-driven integrated hardware-software optimizations
using SimplePower,” 27th
International Symposium on Computer Architecture (ISCA-27), June
2000.
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K. Skadron et al.,
“Temperature-Aware Microarchitecture,”
30th International Symposium on Computer Architecture (ISCA-30),
June 2003.
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H. F. Hamann, P. Bose
et al., “Hot-spot limited microprocessors: direct temperature and
power distribution measurements,” IEEE JSSCC, vol. 42, Issue 1,
January 2007.
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J. Srinivasan, S.
Adve, P. Bose, J. Rivers, “The case for lifetime reliability-aware
microprocessors,” 31st International
Symposium on Computer Architecture (ISCA-31), June 2004.
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X. Li, S. Adve, P.
Bose, J. Rivers, “SoftArch: an architecture-level tool for
modeling and analyzing soft errors,” 35th Annual IEEE/IFIP
International Conference on Dependable Systems and Networks, June
2005.
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X. Li, S. Adve, P.
Bose, J. Rivers, “Architecture-level soft error analysis:
examining the limits of common assumptions,” 37th Annual IEEE/IFIP
International Conference on Dependable Systems and Networks, June
2007.
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J. Shin, V. Zyuban,
P. Bose, J. Rivers, Z. Hu, “A framework for architecture-level
lifetime reliability modeling,” 37th Annual IEEE/IFIP
International Conference on Dependable Systems and Networks, June
2007.
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V. Zyuban, D. Brooks,
V. Srinivasan, P. Bose, M. Gschwind, P. Strenski, P. Emma,
“Integrated power-performance optimization of processor
pipelines,” IEEE Trans. Computers, August 2004.
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C. Isci et al., “An
analysis of efficient multi-core global power management policies:
maximizing performance for a given power budget,” 39th
International Symposium on Microarchitecture (MICRO-39), December,
2006.
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Contact Information |
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Pradip Bose (IBM Watson): pbose {at}
us.ibm.com |
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